With the introduction of automotive technologies such as GPS navigation, onboard diagnostic systems, electric vehicles/battery technology, and autonomous driving, to name a few, developing these products in the automotive sector is becoming increasingly more difficult. Our team has extensive experience working with a diverse scope of automotive products and an understanding of the additional demands in time and detail presented by IATF 16949:2016. Contact us for more information.
- Low Power Optical Microscopy
- High Power Reflected Optical Microscopy
- Scanning Acoustic Microscopy (SAM)
- Photon Emission Microscopy
- Lock‐in Thermography
- Externally Induced Voltage Alteration (XIVA)
- Lock‐in Amplifier Augmented XIVA
- Soft Defect Localization (SDL)
- Laser Assisted Device Alteration (LADA)
- Area Defined Backside Preparation
- Area Defined Die Thinning
- Package Decapsulation
- Lock‐in Amplifier Augmented OBIC
- Optical Beam Induced Current (OBIC)
- PCB Design and Layout
